Item NO.:
GS-C026Payment:
L/C、 Western Union、 D/P、 T/TProduct Origin:
Anhui, ChinaMax Size:
Dia100mmOrientation:
<100>、<110>、<111>Package:
100 clean bag,1000 exactly clean bagProduct Detail
Process flow
Packaging
Transportation
FAQ
InP single crystal substrate
As one of the most important compound semiconductor materials , InP single crystal materials are the key materials for the production of InP -based laser diodes ( LD ), light-emitting diodes ( LEDs ) and photodetectors in optical communications. These devices realize the emission of information in optical fiber communications. , Dissemination, amplification, acceptance and other functions. InP is also very suitable for high-frequency devices, such as high electron mobility transistors ( HEMT ) and heterojunction bipolar transistors ( HBT ). Due to its superior characteristics , it is used in optical fiber communication, microwave, millimeter wave, and anti- Radiation solar cells, heterojunction transistors, and many other high-tech fields have a wide range of applications . The main growth methods of InP single crystal materials include traditional liquid-sealed Czochralski technology ( LEC ), improved LEC technology, and gas pressure controlled Czochralski technology ( VCZ). /PC - LEC ) / Vertical Gradient Solidification Technology ( VGF ) / Vertical Bridgman Technology ( VB ), etc.
Crystals
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structure
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Crystal orientation
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Melting point
o C
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density
g/cm 3
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Forbidden band width
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InP
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cube,
a=5.869 A
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<100>
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1600
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4.79
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1.344
|
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Main performance parameters
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Single crystal
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Doping
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Conductive
type
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Carrier concentration
cm -3
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Mobility (cm 2 /Vs)
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Dislocation density (cm -2 )
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Standard substrate
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InP
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Intrinsic
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N
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(0.4-2)*10 16
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(3.5-4)*10 3
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5*10 4
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Φ2×0.35mm
Φ3×0.35mm
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InP
|
S
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N
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(0.8-3)*10 18
(4-6)*10 18
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(2.0-2.4*10 3
(1.3-1.6*10 3
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3*10 4
2*10 3
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Φ2×0.35mm
Φ3×0.35mm
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InP
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Zn
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P
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(0.6-2)*10 18
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70-90
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2*10 4
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Φ2×0.35mm
Φ3×0.35mm
|
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InP
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Fe
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N
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10 7 -10 8
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³ 2000
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3*10 4
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Φ2×0.35mm
Φ3×0.35mm
|
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Size (mm)
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Dia50.8x0.35mm, 10×10×0.35mm, 10×5×0.35mm can be customized according to customer needs, special orientation and size of the substrate
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Surface roughness
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Surface roughness(Ra):<=5A
Atomic particle microscopy (AFM) test report can be provided |
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polishing
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Single-sided or double-sided
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Package
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Class 100 clean bag, Class 1000 super clean room
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